STEP Height Reference is designed for height ( Z-Axis) calibration of AFM, SEM, Optical and Mechanical Profilers. Features include step heights, lines, and grids of different pitch.

* Step Heights:

   - SiO₂ Steps: 100 nm, 200 nm, 500 nm and 1000 nm

   - Si Steps: 5 μm, 10 μm, 25 μm

* Metal Coating: Cr coating (optional)

* Die Size: 8.0 mm x 8.2 mm x 0.5 mm

* Traceability: NIST calibrated Standards (Optional)